|
|
|
|
|
Equipment |
|
|
|
|
|
|
||||||||
|
|
||||||||
|
|
||||||||
|
|
Ultrahigh Vacuum Scanning
Probe Microscope JSPM-4610
Since its invention in 1982 Scanning Probe Microscope (SPM) confidently holds an important position in surface science. Nowadays it is an essential instrument for surface investigation. Along with this the need for clean sample surface by observation using SPM has grown up and high vacuum environment is necessary to ensure clean sample surface for imaging.
High Vacuum Scanning Probe Microscope (HVSPM) designed by JEOL Corporation is the instrument showing maximal opportunities for surface analysis. When creating this scientific instrument JEOL Corporation has used its many years' experience in manufacturing of scientific instruments .
JSPM-4610 specifications
|
Resolution |
Horizontal 0.14nm(STM) Atomic:resolution(AFM) |
|
Mechanical movements |
Driven by motors |
|
Z movement (approach function) |
Coarsely controls tip-specimen distance. |
|
Auto approach mechanism |
Built-in |
|
X and Y movenets (specimen shift function) |
|
|
Movement ranges |
X and Y: 4 nm (±2 nm)(STM) |
|
Center position indicator |
Built-in |
|
Scanner |
|
|
Type |
Stack share (STM). Tube (AFM) |
|
Maximum movements |
X and Y: 0.2µm (200nm), Z: 0.6 µm (STM) |
|
Scan rotation |
Provided (-180 to + 180°) |
|
Scan speed |
|
|
Scan step |
1.7 ms to 10 s/Line (16 steps) |
|
Scan range |
|
|
Variabe range |
0 to 200 nm (Variable in 12-bit step) |
|
Zoom finction |
provided |
|
Specimen |
|
|
Number of specimens per load |
One (MGL is used for specimen exchange) |
|
Specimen size |
10mm ? 10mm ? 5mm max. |
|
Specimen heating mechanism |
|
|
Heating method |
Direct heating by specimen resistance |
|
Heating temperature |
R.T. (room temperature) to 1200°C or more |
|
Tip |
|
|
Number of tips/load |
One (MGL is used for tip exchange) |
|
Material |
W (tungsten) |
|
Tip cleaning |
High bias functions is used |
|
Drift |
|
|
System drift |
0.05 nm/s or less (at R.T. and high temperature) |
|
Signal detection |
|
|
STM (Scanning tunneling mocroscopy) mode |
|
|
STS (Scanning Tunneling Spectroscopy) mode |
|
|
Tunneling current |
30pA to 1µA |
|
Bias voltage |
|
|
Variable range |
0 to ±10V |
|
Chamber construction |
Three-chamber construction (3 chambers are evacuated independently) |
|
UHV SPM chamber |
For STM stage installation, etc. |
|
Ultimate pressure |
3 x 10-8 Pa or less |
|
Specimen treatment chamber |
For specimen treatment, and tip and specimen parking |
|
Ultimate pressure |
Approx. 10-7 Pa |
|
Specimen airlock |
For tip and specimen exchange |
|
Ultimate pressure |
Approx. 10-4 Pa |
|
Bakeout heater |
Built-in |
|
Vibration isolation devices |
|
|
Air suspension |
Gimbal poston suspension type |
|
Stacking method |
3-stage 4-top-hat type |
|
Computer control system (CCS) |
|
|
Computer system |
Compatible with IBM PC/AT |
|
Image processing system |
|
|
Frame memory size |
512 ? 512 ? 8 bits ? 2 frames |
|
AD and DA converters |
High speed 16-bit |
|
Image display |
High resolution color CRT |
|
Control software |
Scan Menu/setting of SPM mode parameters/setting of X, Y, Z scan speed/SPM Tip Menu |
|
Image processing software |
More than 100 types |
Nuclear Magnetic Resonance spectrometer Bruker AVANCE 400 |
 |
Multi-functional nuclear magnetic resonance spectrometer is designed for structural and dynamic researches at the nanoscale in solids, including both inorganic and organic materials, as well as for study of liquid-phase systems, for study of molecules and molecular systems structure and properties, dynamics of intra-intermolecular exchange processes, reactivity of new classes of organic, organometallic compounds and polymers in solution. Spectroscopy:
|
The base of SPM&RS Center is composed of: ultrahigh-vacuum scanning probe microscope, NMR and EPR spectrometers, optical microscope, magnetron sputtering unit, high-precision analytical balance, derivatograph, single-beam UV-spectrophotometer, freeze-dryer. This equipment was developed and produced by the pre-eminent manufacturers of vacuum and analytical equipment and is certified, that is the necessary requirement when buying analytical equipment.
