The main purpose of the "SPM&RS-Centre" activity is to enable researchers to use ultra-high vacuum scanning probe microscope JSPM-4610 ("Jeol", Japan) and NMR and EPR spectrometers of BRUKER company, which is the state-of-the-art instrument for investigations operated by the qualified stuff able to maintain the equipment in good condition and to provide consulting services.
The Centre of Scanning Probe Microscopy and Resonance Spectroscopy specializes in the field of investigation of physico-chemical properties of surfaces and interfaces and three-dimensional physical and chemical properties of nanobiomaterials and metal-oxide nanosystems.
The Center provides
installed in the Center of Scanning Probe Microscopy and Resonance
Spectrscopy includes high-vacuum probe microscope, NMR and EPR
spectrometers, optical microscope, magnetron sputtering unit,
high-accuracy analytical balance, derivatograph, single beam
spectrophotometer, freeze-drying unit. These instruments are developed
and produced by companies, which are the pre-eminent manufacturers of
vacuum and analytical instrument engineering and are certified against
the necessary requirements.
The Center of Scanning Probe Microscopy provides the services in
research and diagnostics of wide range of materials in different fields
of fundamental and applied science, including study of semiconducting
materials, mineralogy and bilogy:
Morphology examination and measurement of linear dimensions of
nanorelief of surface structures using methods of scanning probe
Specimen size requirements:
STM – scanning tunneling microscopy (conductors and semiconductors)
AFM – atomic force microscopy (conductors, semiconductors, dielectrics)
XPS - X-ray photon spectroscopy
|[Main] [Contacts] [Staff] [Equipment] [Gallery] [Publications] [Service]|