The main purpose of the "SPM&RS-Centre" activity is to enable researchers to use ultra-high vacuum scanning probe microscope JSPM-4610 ("Jeol", Japan) and NMR and EPR spectrometers of BRUKER company, which is the state-of-the-art instrument for investigations operated by the qualified stuff able to maintain the equipment in good condition and to provide consulting services.

The Centre of Scanning Probe Microscopy and Resonance Spectroscopy specializes in the field of investigation of physico-chemical properties of surfaces and interfaces and three-dimensional physical and chemical properties of nanobiomaterials and metal-oxide nanosystems.

The Center provides
•        experimentation using different methods of probe microscopy of atomic structure and surface morphology;
•        compulsory checking of atomic surfaces using methods of scanning tunneling and atomic force microscopy;
•        chemical analysis of the surface composition using X-ray photoelectron spectroscopy;
•        implementation of structural and dynamic researches by NMR and EPR spectroscopy.

Equipment  installed in the Center of Scanning Probe Microscopy and Resonance Spectrscopy includes high-vacuum probe microscope, NMR and EPR spectrometers, optical microscope, magnetron sputtering unit, high-accuracy analytical balance, derivatograph, single beam spectrophotometer, freeze-drying unit. These instruments are developed and produced by companies, which are the pre-eminent manufacturers of vacuum and analytical instrument engineering and are certified against the necessary requirements.

SERVICES LIST

The Center of Scanning Probe Microscopy provides the services in research and diagnostics of wide range of materials in different fields of fundamental and applied science, including study of semiconducting materials, mineralogy and bilogy:

1.       Morphology examination and measurement of linear dimensions of nanorelief of surface structures using methods of scanning probe microscopy.
2.      Investigation morphology and chemical composition of surfaces using methods of atomic force microscopy.
3.      Surface composition analysis using X-ray photoelectron spectroscopy.
4.      Investigation of atomic structure (short-range and long-range order), electronic structure and electron-nuclear system dynamics (nuclear spin, magnon and phonon subsystems, atomic, molecular and fragmentary movement, interatomic and intermolecular interactions) by NMR spectroscopy.

Specimen size requirements:

STM – scanning tunneling microscopy (conductors and semiconductors)
Standart size: length - 7 mm, width - 1 mm, thickness - 0,3 mm
Acceptable size: length - 9 mm, width - 7-9 mm, thickness - 0,3-4 mm

AFM – atomic force microscopy (conductors, semiconductors, dielectrics)
Standart size: length - 7 mm, width - 1 mm, thickness - 0,3 mm

XPS - X-ray photon spectroscopy
Standart size: length - 1 cm, width - 1 cm, thickness - 5 mm