Ultrahigh Vacuum Scanning Probe Microscope

Since its invention in 1982 Scanning Probe Microscope (SPM) confidently holds an important position in surface science. Nowadays it is an essential instrument for surface investigation. Along with this the need for clean sample surface by observation using SPM has grown up and high vacuum environment is necessary to ensure clean sample surface for imaging. High Vacuum Scanning Probe Microscope (HVSPM) designed by JEOL Corporation is the instrument showing maximal opportunities for surface analysis. When creating this scientific instrument JEOL Corporation has used its many years' experience in manufacturing of scientific instruments .

 

Specification JSPM-4610

Resolution
Horizontal

0.14 nm (STM) Atomic resolution (AFM)

Vertical 0.01 nm (STM) Atomic resolution (AFM)
Mechanical movements (Driven by motors)
Z movement (approach function): Coarsely controls tip-specimen distance.
Auto approach mechanism Built-in
X and Y movements (specimen shift function)Movement ranges X and Y: 4 mm (±2 mm) (STM)
X and Y: 2 mm (±1 mm) (AFM)
Center position indicator Buillt-in
Scanner
Type Stack share (STM). Tube (AFM)
Maximum movements X and Y: 0.2 µm (200 nm), Z: 0.6 µm (STM)
X and Y: 10 µm, Z: 2.7 µm (AFM)
Scan rotation Provided (–180 to +180°)
Scan range
Variable range 0 to 200 nm (variable in 12-bit step) (STM)
0 to 10 µm (variable in 12-bit step) (AFM)
Zoom function Provided
Specimen
Number of specimens per load One (MGL is used for specimen exchange)
Specimen size 10mm×10mm×5mm (t) max.(STM)
8mm×7.7mm×2mm (t) max.(AFM)
1mm×7mm×0.3mm (t) for heating
Specimen heating mechanism
Heating method Direct heating by specimen resistance
Heating temperature R.T. (room temperature) to 1200°C or more
Drift
System drift 0.05 nm/s or less (at R.T. and high temperature)
Specimen treatment chamber For specimen treatment, and tip and specimen parking
Ultimate pressure Approx. 10 –7Pa
Specimen airlock For tip and specimen exchange
Ultimate pressure Approx. 10 –4Pa
Bakeout heater Buillt-in

 

Nuclear Magnetic Resonance spectrometer Bruker AVANCE 400

Multi-functional nuclear magnetic resonance spectrometer is designed for structural and dynamic researches at the nanoscale in solids, including both inorganic and organic materials, as well as for study of liquid-phase systems, for study of molecules and molecular systems structure and properties, dynamics of intra-intermolecular exchange processes, reactivity of new classes of organic, organometallic compounds and polymers in solution.

 

Spectroscopy:

1
nuclear magnetic resonance (nuclei of majority chemical elements isotopes, temperature range 77-2000 K, the pulse frequency range up to 20 MHz)
2
NMR relaxation
3
nuclear quadrupole resonance (nuclei with J> 1)

 

The base of SPM&RS Center is composed of: ultrahigh-vacuum scanning probe microscope, NMR and EPR spectrometers, optical microscope, magnetron sputtering unit, high-precision analytical balance, derivatograph, single-beam UV-spectrophotometer, freeze-dryer. This equipment was developed and produced by the pre-eminent manufacturers of vacuum and analytical equipment and is certified, that is the necessary requirement when buying analytical equipment.